Equipment

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Innovative developments require extensive expertise. In the field of laser technology, the interaction between laser development and laser applications is of outstanding importance. New lasers allow new applications and new applications set the stage for new laser systems. Therefore, the Chair for Laser Technology constantly extends in cooperation with the Fraunhofer Institute for Laser Technology ILT and with leading laser manufacturers and innovative laser consumers its core competencies. The basis for the core competences are highly qualified engineers and scientists from various disciplines.

Technical Infrastructure
The technical infrastructure of the Chair includes a mechanical and electronic workshop, a metallurgy laboratory, a photo laboratory, a laboratory for optical measurements as well as a design department.

Scientific Infrastructure
The scientific infrastructure includes e.g. a literature library, literature and patent databases and scientific oriented software and databases for process documentation.

Equipment List
The equipment of the Chair for Laser Technology is constantly maintained at the state of the art. It currently comprises as essential components:

Laser sources

  • Solid-state lasers with pulse durations from microseconds to femtoseconds
  • Excimer laser and CO2 laser
  • Diode laser systems
  • Fiber laser

Processing stations

  • multi-axis handling systems (micro tables to portal systems)
  • Beam delivery systems (optics, fiber)
  • Robotic Systems
  • Touch Probes
  • Direct-writing- and pulsed laser deposition system
  • Clean room for mounting diodes

Analysis options

  • High-speed photography with exposure times up to 200 ps minimal or frame rates of up to a maximum of 50 kHz
  • Thermography (wavelength range 3-5 microns, 60 bps, spatial resolution 200 μm²)
  • Holographic means for vibration analysis and speckle interferometry
  • Laser triangulation sensors for distance and contour measurement
  • Laser coordinate measuring machine
  • Laser spectroscopy systems for temperature measurement in gases
  • XPS and AES for elemental analysis
  • Raman spectroscopy
  • Ellipsometry to measure coating thickness and refractive index determination
  • White-light interference microscopy to measure the surface topography
  • UV-VIS and FTIR spectroscopy
  • SEM and EDX
  • confocal microscopy