Soft X‐Ray Microscopic Investigation on Self Assembling Nanocrystals

Benk, Markus Peter; Bergmann, Klaus; Querejeta-Fernandez, A.; Srivastava, S.; Kotov, N. A.; Schäfer, Dagmar; Wilhein, Thomas

Melville, N. Y / AIP (2011) [Buchbeitrag, Beitrag zu einem Tagungsband]

The 10th international conference on X-ray microscopy : Chicago, Illinois, USA 15 – 20 August 2010 / ed by SIan McNulty ... Sponsoring organizations: U.S. Department of Energy ...
Seite(n): 433-436

Identifikationsnummern