Soft X‐Ray Microscopic Investigation on Self Assembling Nanocrystals

Melville, N. Y / AIP (2011) [Contribution to a book, Contribution to a conference proceedings]

The 10th international conference on X-ray microscopy : Chicago, Illinois, USA 15 – 20 August 2010 / ed by SIan McNulty ... Sponsoring organizations: U.S. Department of Energy ...
Page(s): 433-436

Authors

Selected Authors

Benk, Markus Peter
Bergmann, Klaus
Querejeta-Fernandez, A.
Srivastava, S.
Kotov, N. A.

Other Authors

Schäfer, Dagmar
Wilhein, Thomas

Identifier