Packaging and characterization equipment for high-power diode laser bars and VCSELs

Boucke, Konstantin; Jandeleit, Jürgen; Brandenburg, Wolfgang; Ostlender, Andreas; Loosen, Peter; Poprawe, Reinhart

Bellingham, Wash : SPIE, the International Society for Optical Engineering (2001)
Buchbeitrag, Beitrag zu einem Tagungsband

In: Testing, reliability, and applications of optoelectronic devices : 24 - 26 January 2001, San Jose, USA / sponsored and publ. by SPIE, the International Society for Optical Engineering. Aland K. Chin .̤, chairs/ed
Seite(n)/Artikel-Nr.: 165-172

Identifikationsnummern