Packaging and characterization equipment for high-power diode laser bars and VCSELs

Bellingham, Wash / SPIE, the International Society for Optical Engineering (2001) [Contribution to a book, Contribution to a conference proceedings]

Testing, reliability, and applications of optoelectronic devices : 24 - 26 January 2001, San Jose, USA / sponsored and publ. by SPIE, the International Society for Optical Engineering. Aland K. Chin .̤, chairs/ed
Page(s): 165-172

Authors

Selected Authors

Boucke, Konstantin
Jandeleit, Jürgen
Brandenburg, Wolfgang
Ostlender, Andreas
Loosen, Peter

Other Authors

Poprawe, Reinhart

Identifier