Non-interferometric transient quantitative phase microscopy for ultrafast engineering

Berlin [u.a.] / Springer (2008) [Contribution to a conference proceedings, Journal Article]

Applied physics / A, Materials science & processing
Volume: 93
Issue: 1
Page(s): 165-169

Authors

Authors

Horn, Alexander
Mingareev, Ilja
Werth, Alexander
Kachel, Martin
Brenk, Udo

Identifier