Reliability and degradation mechanisms of InGa(Al)As/GaAs DQW high-power diode lasers

Kreutz, E. W.; Wiedmann, Nicolas; Jandeleit, J├╝rgen; Hoffmann, D.; Loosen, Peter; Poprawe, Reinhart

Amsterdam : North-Holland Publ. Co. (2000)
Journal Article

In: Journal of crystal growth
Volume: 210
Issue: 1/3
Page(s)/Article-Nr.: 313-317

Identifier