Reliability and degradation mechanisms of InGa(Al)As/GaAs DQW high-power diode lasers

Amsterdam / North-Holland Publ. Co. (2000) [Journal Article]

Journal of crystal growth
Volume: 210
Issue: 1/3
Page(s): 313-317

Authors

Selected Authors

Kreutz, E. W.
Wiedmann, Nicolas
Jandeleit, J├╝rgen
Hoffmann, D.
Loosen, Peter

Other Authors

Poprawe, Reinhart

Identifier