Packaging and characterization of high power diode lasers

Bellingham, Wash / SPIE, Int. Soc. for Optical Eng. (2000) [Buchbeitrag, Beitrag zu einem Tagungsband]

Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II; Testing, packaging, and reliability of semiconductor lasers V : 26 - 25 [!] January 2000, San Jose, California / Geoffrey T. Burnham ..., chairs/ed.
Seite(n): 270-277