Packaging and characterization of high power diode lasers

Bellingham, Wash / SPIE, Int. Soc. for Optical Eng. (2000) [Contribution to a book, Contribution to a conference proceedings]

Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II; Testing, packaging, and reliability of semiconductor lasers V : 26 - 25 [!] January 2000, San Jose, California / Geoffrey T. Burnham ..., chairs/ed.
Page(s): 270-277


Selected Authors

Jandeleit, J├╝rgen
Wiedmann, Nicolas
Ostlender, Andreas
Brandenburg, Wolfgang
Loosen, Peter

Other Authors

Poprawe, Reinhart