A laboratory X-ray microscope with a plasma X-ray source

Schmahl, G.; Niemann, B.; Rudolph, D.; Diehl, M.; Thieme, J.; Neff, W.; Holz, R.; Herziger, G.; Richter, F.

Berlin [u.a.] / Springer (1991) [Buchbeitrag]

X-ray microscopy III : proceedings of the third international conference, London, September 3 - 7, 1990 ; [XRM 90] / A. G. Michette ... (ed.)
Seite(n): 66

Identifikationsnummern

  • REPORT NUMBER: RWTH-CONV-102569